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E-H-Metrology - Model MX 102-6 - Manual Wafer Measurement Tool
From Manual Tools
Up to four thickness measuring range user selectable. Dynamic range 100 or 350µm. Wafer diameter 4', 5' and 6'. Accuracy 0.1µm. Resolution 10nm. Spartial resolution 1mm. 4 scans. Software MXNT.
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